Fraunhofer Institute for Physical Measurement Techniques IPM
Fraunhofer Institute for Physical Measurement Techniques IPM
Time Domain Thermal Reflectance (TDTR): Measuring thermal conductivity of thin films
© Fraunhofer IPM
Optical setup for TDTR measurements at Fraunhofer IPM. This is where the thermal conductivity of thin films can be determined effectively, quickly and economically.

Customized measurement technology

The characterization of functional materials forms part of our daily business. To you as a costumer, we offer extensive know-how and the measurement of your materials in our excellently equipped laboratories.

© Fraunhofer IPM

Measurement technology for the determination of thermophysical properties

On your behalf, we determine the thermophysical properties of material samples.

We offer customized solutions for your contract measurement. For this purpose, various measuring stations and techniques are available at our laboratories.

Parameters:

  • Electrical conductivity / specific resistance
  • Charge carrier concentration and charge carrier mobility
  • Thermal conductivity and heat capacity
  • Coefficient of thermal expansion
  • Seebeck coefficient
  • Thermal decomposition or phase transition temperature
  • Density determination (liquid, solid)

Methods/Procedures:

  • 3-omega measuring stations
  • Hall measuring stations
  • Laser flash analysis
  • Differential scanning calorimetry (DSC)
  • Time domain thermal reflectance (TDTR)