Fraunhofer Institute for Physical Measurement Techniques IPM
Fraunhofer IPM disposes of extensive equipment and numerous methods for analyzing developed, functional materials and surfaces.
- 3D Computed Tomography (CT)
- Ellipsometry
- Profilometry
- Scanning electron microscope (SEM) with energy dispersive X-ray spectroscopy (EDX) and electron backscatter diffraction (EBSD)
- Laser scanning microscope
- Fluorescence measuring system
- Multi-wavelength holography measurement system